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Spray Pyrolysis Synthesized and ZnO–NiO Nanostructured Thin Films Analysis with Their Nanocomposites for Waveguiding Applications
Semiconductors ( IF 0.6 ) Pub Date : 2021-02-03 , DOI: 10.1134/s1063782621010085
B. Gharbi , A. Taabouche , M. Brella , R. Gheriani , Y. Bouachiba , A. Bouabellou , F. Hanini , S. Barouk , H. Serrar , B. Rahal

Abstract

In this work, we have prepared ZnO, NiO, and nanocomposites ZnO–NiO thin films elaborated by the chemical method of spray pyrolysis on glass substrates at a temperature of 480°C. The prepared samples have been analyzed by means of the X-ray diffraction (XRD), UV-visible spectrophotometry, micro-Raman and m-lines spectroscopies techniques. The structure of the thin ZnO films is hexagonal of the wurtzite type with a preferential orientation along the axis (002). The size of the crystallites, deduced from the XRD measurements, varies between 25 and 43 nm. The NiO films crystallize in the cubic structure with the size 4 nm of the crystallites. The micro-Raman study confirms the XRD results showing the presence of the vibrational modes characteristics of the wurtzite structure of ZnO and the cubic structure of NiO. The obtained films have an optical transmission varying from 60 to 95% in the visible region. The forbidden optical band energies, deduced from the transmittance, are 3.28 and 3.89 eV for the ZnO and NiO films, respectively. The optical waveguiding measurements carried out on pure ZnO and ZnO–NiO films show single-guided modes behavior (TE0 and TM0). These measurements have allowed deducing the thickness and the refractive index values which are respectively 250 nm and 1.89 for ZnO, 165 nm and 1.80 for ZnO–NiO thin films.



中文翻译:

喷雾热解合成ZnO-NiO纳米结构薄膜及其纳米复合材料在波导中的应用

摘要

在这项工作中,我们制备了ZnO,NiO和纳米复合ZnO–NiO薄膜,该薄膜是通过在480°C的温度下在玻璃基板上进行喷雾热解的化学方法制成的。制备的样品已通过X射线衍射(XRD),紫外可见分光光度法,微拉曼光谱和m线分光光度法进行了分析。ZnO薄膜的结构是纤锌矿型六方晶,沿轴(002)取向优先。根据XRD测量得出的微晶尺寸在25至43 nm之间变化。NiO膜以立方结构结晶,微晶尺寸为4 nm。显微拉曼研究证实了XRD结果,表明ZnO纤锌矿结构和NiO立方结构的振动模式特征存在。所获得的膜在可见光区域的透光率在60%到95%之间变化。ZnO和NiO薄膜的透射率推导的禁带能分别为3.28和3.89 eV。在纯ZnO和ZnO-NiO薄膜上进行的光波导测量显示出单导模行为(TE0和TM 0)。通过这些测量,可以得出ZnO的厚度和折射率分别为250 nm和1.89,ZnO-NiO薄膜的厚度和折射率分别为165 nm和1.80。

更新日期:2021-02-03
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