In this work, albedo parameters and effective atomic numbers of the PEDOT/carbon black (C) composites were determined by the gamma ray spectrometry. EDOT monomers were polymerized on carbon black (Cabot, Vulcan XC 72R) at room temperature. Ammonium persulphate (APS) was used as the oxidant. The primary dopants including polystyrene sulfonic acid (PSSA), p-toluenesulfonic acid (p-TSA) and camphor sulfonic acid (CSA) were added with the secondary ethylene glycol (EG) or DMSO dopants. Synthesized composites were physically characterized by using Raman spectroscopy in order to determine the defective sites. Albedo parameters and effective atomic numbers of PEDOT/C composites were carried out by using a HPGe detector and 59.54 keV gamma-rays emitted from a radioactive source of ²⁴¹Am (59.54 keV). Compton and coherent peaks were determined at XRF spectra. It is observed that albedo parameters of the composites appear to be enhanced significantly with the CSA dopant. The impact of p-TSA dopant decreased the reflective power of the PEDOT surface. The S2 composite with low effective atomic number (Zeff.exp.=5.68) is more scatterer than the S4 composite with high effective atomic number (Zeff.exp.=6.78). It can be said that the effective atomic number results obtained by scattering experiments are more reliable than WinXCOM since the material components and geometric modeling technology for absorption are generally assumed to be uniform distribution, and parameters related to sample properties are not taken into account.

在这项工作中，通过伽马射线光谱法确定了PEDOT /炭黑（C）复合材料的反照率参数和有效原子序数。室温下，将EDOT单体在炭黑（Cabot，Vulcan XC 72R）上聚合。过硫酸铵（APS）用作氧化剂。将包括聚苯乙烯磺酸（PSSA），对甲苯磺酸（p-TSA）和樟脑磺酸（CSA）的主要掺杂剂与次要乙二醇（EG）或DMSO掺杂剂一起添加。通过使用拉曼光谱法对合成的复合材料进行物理表征，以确定缺陷部位。PEDOT / C复合材料的反照率参数和有效原子序数是通过使用HPGe检测器和从²⁴¹放射源发出的59.54 keV伽马射线进行的美国（59.54 keV）。康普顿峰和相干峰在XRF光谱上确定。观察到，使用CSA掺杂剂，复合物的反照率参数似乎显着提高。p-TSA掺杂剂的影响降低了PEDOT表面的反射能力。有效原子序数低（Zeff.exp。= 5.68）的S2复合材料比有效原子序数高（Zeff.exp。= 6.78）的S4复合材料散射更多。可以说，通过散射实验获得的有效原子序数结果比WinXCOM更可靠，因为通常假定吸收的材料成分和几何建模技术是均匀分布的，并且不考虑与样品特性有关的参数。