We have succeeded in operating a transition-edge sensor (TES) spectrometer and evaluating its performance at the SPring-8 synchrotron x-ray light source. The TES spectrometer consists of a 240 pixel National Institute of Standards and Technology (NIST) TES system, and 220 pixels are operated simultaneously with an energy resolution of 4 eV at 6 keV at a rate of ∼1 c/s pixel⁻¹. The tolerance for high count rates is evaluated in terms of energy resolution and live time fraction, leading to an empirical compromise of ∼2 × 10³ c/s (all pixels) with an energy resolution of 5 eV at 6 keV. By utilizing the TES’s wideband spectroscopic capability, simultaneous multi-element analysis is demonstrated for a standard sample. We conducted x-ray absorption near-edge structure (XANES) analysis in fluorescence mode using the TES spectrometer. The excellent energy resolution of the TES enabled us to detect weak fluorescence lines from dilute samples and trace elements that have previously been difficult to resolve due to the nearly overlapping emission lines of other dominant elements. The neighboring lines of As Kα and Pb Lα2 of the standard sample were clearly resolved, and the XANES of Pb Lα2 was obtained. Moreover, the x-ray spectrum from the small amount of Fe in aerosols was distinguished from the spectrum of a blank target, which helps us to understand the targets and the environment. These results are the first important step for the application of high resolution TES-based spectroscopy at hard x-ray synchrotron facilities.

中文翻译：

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在SPring-8上使用过渡边缘传感器进行宽带高能分辨率硬X射线光谱分析

我们已经成功运行了过渡边缘传感器（TES）光谱仪，并在SPring-8同步加速器X射线光源上评估了其性能。TES光谱仪由一个240像素的美国国家标准与技术研究院（NIST）TES系统组成，并且以约1 c / s像素^-1的速率在6 keV下以4 eV的能量分辨率同时运行220个像素。根据能量分辨率和实时时间分数评估了高计数率的容差，从而导致了约2×10 ³的经验折衷c / s（所有像素），在6 keV时的能量分辨率为5 eV。通过利用TES的宽带光谱功能，可以同时对标准样品进行多元素分析。我们使用TES光谱仪在荧光模式下进行了X射线吸收近边缘结构（XANES）分析。TES具有出色的能量分辨率，使我们能够检测到稀释的样品和痕量元素中的弱荧光线，这些元素以前由于其他主要元素的发射谱线几乎重叠而难以解析。的为k的相邻线α和Pb大号α标准样品的2例清楚地分辨，和Pb L的XANES α获得2。此外，气溶胶中少量铁的X射线光谱与空白目标的光谱有所区别，这有助于我们了解目标和环境。这些结果是在硬X射线同步加速器设施中应用基于高分辨率TES的光谱学的重要的第一步。