Speckle patterns have been used widely in imaging techniques such as ghost imaging, dynamic speckle illumination microscopy, structured illumination microscopy, and photoacoustic fluctuation imaging. Recent advances in the ability to control the statistical properties of speckles has enabled the customization of speckle patterns for specific imaging applications. In this work, we design and create special speckle patterns for parallelized nonlinear pattern-illumination microscopy based on fluorescence photoswitching. We present a proof-of-principle experimental demonstration where we obtain a spatial resolution three times higher than the diffraction limit of the illumination optics in our setup. Furthermore, we show that tailored speckles vastly outperform standard speckles. Our work establishes that customized speckles are a potent tool in parallelized super-resolution microscopy.

中文翻译：

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通过自定义散斑规避光学衍射极限

斑点图案已被广泛用于成像技术中，例如重影成像，动态斑点照明显微镜，结构化照明显微镜和光声起伏成像。控制斑点统计特性的能力的最新进展使得能够为特定成像应用定制斑点图案。在这项工作中，我们设计和创建特殊的斑点图案，用于基于荧光光开关的并行化非线性图案照明显微镜。我们提供了原理验证的实验演示，其中我们获得的空间分辨率比我们设置中照明光学器件的衍射极限高出三倍。此外，我们显示，量身定制的斑点大大优于标准斑点。