The Timepix3 radiation imaging and particle tracking detector is the direct successor to the Timepix semiconductor detector developed in CERN. The Timepix ASIC chip (256 × 256 pixels with a pitch of 55 $\mathrm{\mu }$m provides the possibility to operate each of the 65 536 pixels in one of the following modes: (1) event counting (Medipix mode); (2) energy measurement (Time over Threshold — ToT mode); and (3) measurement of the interaction time (Time of Arrival — ToA mode). The Timepix3 chip of the new generation introduces the ability to measure ToT and ToA simultaneously and also the event-based readout where each hit pixel is read out immediately after the hit. This detector can be used in a variety fields of science including particle physics, X-ray imaging as well as medicine and space science. With regards to the wide application possibilities of this detector, we investigate the properties of the detector in the temperature range from −20 °C to ＋80 °C. This temperature range spans the majority of laboratory conditions as well as requirements for most of outer space missions. This paper describes thermal-vacuum testing of the most common 300 µm Si detector with AdvaPIX readout interface in the counting mode. The detector was stabilised under various thermal conditions in a thermal vacuum chamber and subsequently exposed to characteristic X-ray radiation of 5 elements in the energy range of 4–24 keV. It was found that the absolute measurement accuracy of higher energies is more affected by higher temperature (up to 0.8 keV @ 17.48 keV) and relative error of Timepix3 accuracy is inversely proportional to the incident X-ray energy. The relative precision is kept in the range of 6 % for temperatures from −20 °C to ＋60 °C with significant change at ＋80 °C.

Timepix3辐射成像和粒子跟踪探测器是CERN开发的Timepix半导体探测器的直接后继产品。Timepix ASIC芯片（256×256像素，间距为55 $\mathrm{\mu }$m提供了以 下列模式之一操作65 536个像素的可能性：（1）事件计数（Medipix模式）；（2）能量测量（超过阈值的时间— ToT模式）；（3）互动时间的测量（到达时间-ToA模式）。新一代的Timepix3芯片具有同时测量ToT和ToA的功能，以及基于事件的读数功能，其中，在命中后立即读取每个命中像素。该探测器可用于多种科学领域，包括粒子物理学，X射线成像以及医学和太空科学。考虑到该探测器的广泛应用可能性，我们研究了在-20  °C至+80温度范围内的探测器性能 ℃。该温度范围涵盖了大多数实验室条件以及大多数外太空任务的要求。本文介绍 了在计数模式下，最常见的具有AdvaPIX读出接口的300 µm Si检测器的热真空测试。检测器在热真空室内的各种热条件下稳定下来，随后暴露于4-24  keV能量范围内的5种元素的特征X射线辐射。已经发现，较高能量的绝对测量精度更受较高温度（最高可达0.8 千电子伏 @  17.48 千电子伏）和Timepix3精度的相对误差是反比于入射的X射线的能量。相对精度保持在6范围内 从−20  °C到＋60  °C的温度的％，在＋80  °C时有显着变化。