In a conventional scattering-type scanning near-field optical microscopy setup, the atomic force microscope probe is unable to effectively couple with s-polarized light, resulting in low signal and limited in-plane sensitivity. This study aims to investigate a high-resolution probe with enhanced responsivity to both s- and p-polarized light. Full-wave electromagnetic method of moments simulations are utilized. Simulated near-field spectra on prototypical materials (SiO₂, Si, SrTiO₃), as well as simulated raster scans of a gap nanoantenna, indicate a two order of magnitude increase of the scattering signal for s-polarized incident and detection scheme compared to the conventional probe.

在传统的散射型扫描近场光学显微镜设置中，原子力显微镜探针无法有效地与 s 偏振光耦合，导致信号低和面内灵敏度有限。本研究旨在研究对 s 和 p 偏振光具有增强响应度的高分辨率探针。采用全波电磁矩模拟方法。原型材料（SiO ₂、Si、SrTiO ₃）上的模拟近场光谱以及间隙纳米天线的模拟光栅扫描表明，与 s 偏振入射和检测方案相比，散射信号增加了两个数量级常规探头。