Charge-Induced Birefringence in a Room-Temperature Ionic Liquid,The Journal of Physical Chemistry B

当前位置： X-MOL 学术 › J. Phys. Chem. B › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

Charge-Induced Birefringence in a Room-Temperature Ionic Liquid
The Journal of Physical Chemistry B ( IF 2.8 ) Pub Date : 2021-01-19 , DOI: 10.1021/acs.jpcb.0c10045
Yufeng Wang ₁ , Greg M. Swain ₁ , G. J. Blanchard ₁

Affiliation

We have reported previously on the existence of a surface charge-induced free charge density gradient (ρ_f) in room-temperature ionic liquids (RTILs) with a characteristic persistence length of ca. 50 μm [Ma, K. Langmuir 2016, 32, 9507−9512]. The free charge density gradient is related to the dielectric response of the RTIL. We report here on the existence of a surface charge-induced gradient in the RTIL refractive index and quantify the relationship between the index gradient and ρ_f. Because ρ_f is uniaxial, the induced refractive index gradient is manifested as an induced birefringence. The RTIL sample holder has a curved surface such that the RTIL can function as a lens, and ρ_f is controlled by the surface charge density (σ_s) of the (concave) RTIL support. Current passed through an indium-doped tin oxide (ITO) surface layer on the support surface controls σ_s. The far-field image of light passed through the RTIL lens as a function of σ_s is used to measure the charge-induced changes of n in the RTIL. We demonstrate a modulation of the refractive index on the order of 15%, proportional to σ_s. This report places the relationship between ρ_f and RTIL dielectric response on a quantitative footing and suggests the utility of RTILs for electro-optic applications.

中文翻译：

室温离子液体中的电荷诱导双折射

我们已经在表面电荷引起的自由电荷密度梯度（ρ的存在先前报道_˚F用约的特性持续长度在室温离子液体（离子液体））50微米[马K 朗缪尔 2016， 32，9507-9512]。自由电荷密度梯度与RTIL的介电响应有关。在这里，我们报告中RTIL折射率的表面电荷引入的梯度的存在和量化指标梯度和ρ之间的关系_˚F。因为ρ_˚F是单轴，感应折射率梯度表现为一个引起的双折射。所述RTIL样本保持器具有弯曲表面，使得可以RTIL作为透镜发挥作用，ρ_˚F由表面电荷密度（σ控制_小号的（凹的）RTIL支持的）。电流通过的铟掺杂的氧化锡传递（ITO）表面上的支撑表面的控制σ层_小号。的光通过透镜RTIL作为σ的函数传递远场图像_小号被用于测量的电荷引起的变化Ñ在RTIL。我们证明的15％的数量级上的折射率的调制，正比于σ_小号。此报告放置ρ之间的关系_˚F上的定量基础和RTIL介电响应，并建议的RTIL用于电光应用的效用。

更新日期：2021-01-28

点击分享查看原文

点击收藏

阅读更多本刊最新论文