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Optical and Electronic Losses Arising from Physically Mixed Interfacial Layers in Perovskite Solar Cells
ACS Applied Materials & Interfaces ( IF 8.3 ) Pub Date : 2021-01-20 , DOI: 10.1021/acsami.0c16364
Biwas Subedi 1 , Zhaoning Song 1 , Cong Chen 1 , Chongwen Li 1 , Kiran Ghimire 1 , Maxwell M. Junda 1 , Indra Subedi 1 , Yanfa Yan 1 , Nikolas J. Podraza 1
Affiliation  

Perovskite solar cell device performance is affected by optical and electronic losses. To minimize these losses in solar cells, it is important to identify their sources. Here, we report the optical and electronic losses arising from physically mixed interfacial layers between the adjacent component materials in highly efficient two terminal (2T) all-perovskite tandem, single-junction wide-bandgap, and single-junction narrow-bandgap perovskite-based solar cells. Physically mixed interfacial layers as the sources of optical and electronic losses are identified from spectroscopic ellipsometry measurements and data analysis followed by comparisons of simulated and measured external quantum efficiency spectra. Parasitic absorbance in the physically mixed regions between silver metal electrical contacts and electron transport layers (ETLs) near the back contact and a physical mixture of commercial indium tin oxide and hole transport layers (HTL) near the front electrical contact lead to substantial optical loss. A lower-density void + perovskite nucleation layer formed during perovskite deposition at the interface between the perovskite absorber layer and the HTL causes electronic losses because of incomplete collection of photogenerated carriers likely originating from poor coverage and passivation of the initially nucleating grains.

中文翻译:

钙钛矿太阳能电池中物理混合界面层引起的光电子损耗

钙钛矿太阳能电池器件的性能受光学和电子损耗的影响。为了使太阳能电池中的这些损失最小化,重要的是确定其来源。在这里,我们报告了基于高效两端子(2T)全钙钛矿串联,单结宽带隙和单结窄带隙钙钛矿的相邻组件材料之间物理混合界面层所引起的光学和电子损耗太阳能电池。物理混合界面层是光学和电子损耗的来源,可通过椭圆偏振光谱测量和数据分析确定,然后比较模拟和测量的外部量子效率谱。银金属电触点和背触点附近的电子传输层(ETL)之间的物理混合区域中的寄生吸收,以及商用电铟锡氧化物和前电触点附近的空穴传输层(HTL)的物理混合物,会导致大量的光损耗。在钙钛矿吸收层和HTL之间的界面处钙钛矿沉积期间形成的较低密度的空隙+钙钛矿成核层会导致电子损耗,因为光生载流子的收集不完全,这可能是由于最初成核晶粒的覆盖率低和钝化所致。
更新日期:2021-02-03
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