The external magnetic field might affect the performances of electromechanical nano-bridges sensors and switches. While different physical phenomena on the behavior of nano-electromechanical systems have been addressed, few works have been done on the inspiration of the magnetic flux on the performance of these systems. Herein, the primary field equations necessary for dynamic instability analysis of electromechanical nano-bridges subjected to an external magnetic flux are extracted. The simultaneous effects of scale dependency and surface energies are considered in the proposed. To this end, the consistent couple stress theory is incorporated with the surface elasticity. Next, the system's nonlinearity is defined by using von-Karman nonlinear strains. Also, the impact of vacuum fluctuation is also considered in the developed model. A reduced-order procedure is designed to solve the constitutive equation, and the effects of the longitudinal magnetic field on the instability of nano-bridge are examined. The outcomes demonstrate that the longitudinal magnetic flux considerably increases the instability voltage of the nano-bridge.

外部磁场可能会影响机电纳米桥传感器和开关的性能。虽然已经解决了有关纳米机电系统行为的不同物理现象，但在磁通量对这些系统性能的启发方面所做的工作很少。在此，提取了经受外部磁通量的机电纳米桥的动态不稳定性分析所必需的主场方程。在提议中考虑了尺度依赖性和表面能的同时影响。为此，将一致的偶应力理论与表面弹性结合在一起。接下来，使用von-Karman非线性应变定义系统的非线性。此外，在开发的模型中还考虑了真空波动的影响。设计了降阶方法求解本构方程，并研究了纵向磁场对纳米桥失稳的影响。结果表明，纵向磁通量大大增加了纳米桥的不稳定性电压。