Quantum cellular automata (QCA) is a promising paradigm that enables performing arithmetic and logic operations at the nanoscopic scale. The QCA utilizes the configuration of electric charges in molecular scale quantum-dots to encode binary information. Defects are very likely to occur at the nanoscale and impact the operation of QCA devices. We concentrate on a specific fault, which is caused by impurities in materials used in packaging devices. These defects may cause a single-electron to tunnel outside a QCA cell and lead to a single-electron fault (SEF). Cosmic rays may also lead to a SEF. The three-input majority gate is the primary device in the QCA paradigm. In this paper, the effect of redundant cells on the fault tolerance of the majority gate is studied in the presence of a SEF. We present figures based on the number of redundant cells, their positions, and the clock method, which are essential in designing SEF-tolerant devices.

中文翻译：

---

量子元胞自动机多数门中的单电子容错

量子元胞自动机 (QCA) 是一种很有前途的范式，可以在纳米尺度上执行算术和逻辑运算。QCA 利用分子尺度量子点中的电荷配置来编码二进制信息。缺陷很可能发生在纳米级并影响 QCA 设备的运行。我们专注于一个特定的故障，它是由包装设备中使用的材料中的杂质引起的。这些缺陷可能会导致单电子在 QCA 电池外隧穿并导致单电子故障 (SEF)。宇宙射线也可能导致 SEF。三输入多数门是 QCA 范例中的主要设备。在本文中，在存在 SEF 的情况下，研究了冗余单元对多数门容错的影响。我们根据冗余单元的数量呈现数字，