The paper introduces a model of dielectric breakdown strength. The model integrated thermal breakdown and defect models, representing the relationship between the electric field of ferroelectric films and dimensional parameters and operating temperature. This model is verified with experimental results of the lead lanthanum zirconate titanate (PLZT) films of various film thickness (d = 0.8–3 μm), electrode area (A = 0.0020–25 mm²) tested under a range of operating temperature (T = 300–400 K) with satisfying fitting results. Also learned is a relationship that the recoverable electric energy density is directly proportional to the square of breakdown electric field. This relationship is found viable in predicting the electric energy density in terms of variables of d, A, and T for the PLZT films.

本文介绍了介电击穿强度的模型。该模型集成了热击穿模型和缺陷模型，表示铁电薄膜的电场与尺寸参数和工作温度之间的关系。该模型通过各种膜厚（d = 0.8–3μm ），电极面积（A = 0.0020–25 mm ²）在一定工作温度（T）下测试的钛酸锆钛酸铅（PLZT）膜的实验结果得到了验证。= 300–400 K），拟合结果令人满意。还了解到可恢复电能密度与击穿电场的平方成正比的关系。发现该关系对于根据PLZT膜的d，A和T的变量预测电能密度是可行的。