A recent work showed that it is possible to transform a single-cycle test for stuck-at faults into a launch-on-shift (LOS) test that is guaranteed to detect the same stuck-at faults without any logic or fault simulation. The LOS test also detects transition faults. This was used for obtaining a compact LOS test set that detects both types of faults. In the scenario where LOS tests are used for both stuck-at and transition faults, this article observes that, under certain conditions, the detection of a stuck-at fault guarantees the detection of a corresponding transition fault. This implies that the two faults are equivalent under LOS tests. Equivalence can be used for reducing the set of target faults for test generation and test compaction. The article develops this notion of equivalence under LOS tests with equal primary input vectors and provides an efficient procedure for identifying it. It presents experimental results to demonstrate that such equivalences exist in benchmark circuits, and shows an unexpected effect on a test compaction procedure.

中文翻译：

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具有相等主输入向量的换档启动 (LOS) 测试下的等效故障

最近的一项工作表明，可以将针对卡住故障的单周期测试转换为轮班启动 (LOS) 测试，该测试可以保证在没有任何逻辑或故障模拟的情况下检测到相同的卡住故障。LOS 测试还检测转换故障。这用于获得一个紧凑的 LOS 测试集，可以检测这两种类型的故障。在 LOS 测试同时用于固定故障和转换故障的场景中，本文观察到，在某些条件下，固定故障的检测保证了相应转换故障的检测。这意味着这两个故障在 LOS 测试下是等效的。等效性可用于减少测试生成和测试压缩的目标故障集。本文在具有相同主要输入向量的 LOS 测试下发展了这种等效性概念，并提供了一种有效的识别过程。它提供了实验结果以证明基准电路中存在这种等价性，并显示了对测试压缩过程的意外影响。