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Optimization of transparent amorphous oxide-metal-amorphous oxide multilayer with high figure of merit for high transmittance and low resistivity
Optical Materials ( IF 3.8 ) Pub Date : 2021-01-14 , DOI: 10.1016/j.optmat.2021.110820
Sang Yeol Lee

Highly transparent amorphous oxide-metal-amorphous oxide (OMO) multilayers were fabricated at room temperature using amorphous semiconducting Si–Zn–Sn–O (SZTO) metal oxide and metallic silver. Amorphous SZTO (a-SZTO) showed high refractive index of 2.04 which is comparable to crystalline ITO, and wide optical bandgap (Eg) of 3.26 eV, allowing transmitting of wavelength above 380 nm. SZTO based OMO showed low resistivity at the level of 10−5 Ω cm by inserting an Ag layer. After optimizing the optical and electrical properties by changing Ag and SZTO sublayer thickness, a transparent conductive electrode with high average transmittance of 96.5% in visible region and low resistivity of 7.158 × 10−5 Ω cm was fabricated at room temperature. The results show that SZTO is a promising sublayer for high performance transparent conducting oxides applications.



中文翻译:

高品质因数的高透射率和低电阻率的透明非晶氧化物-金属-非晶氧化物多层膜的优化

室温下使用非晶态半导体Si-Zn-Sn-O(SZTO)金属氧化物和金属银制造高度透明的非晶氧化物-金属非晶氧化物(OMO)多层。非晶态SZTO(a-SZTO)显示出2.04的高折射率,可与晶体ITO相媲美,而光学带隙(E g)则为3.26 eV,可透射380 nm以上的波长。基于SZTO OMO显示出低电阻率在10水平-5  Ω厘米通过插入Ag层。通过改变Ag和SZTO子层的厚度来优化光学和电学性能后,透明导电电极在可见光区域的平均透射率高达96.5%,电阻率低至7.158×10 -5 Ωcm在室温下制造。结果表明,SZTO是用于高性能透明导电氧化物应用的有前途的子层。

更新日期:2021-01-14
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