ABSTRACT

A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.

摘要

已经开发了一种从经典Wilkens方法演变而来的新颖方法，用于基于通过3D同步加速器单色X射线微衍射获得的X射线径向轮廓来量化局部位错密度。由γ基体和γ '析出物组成的变形Ni基高温合金已被用作模型材料。定量结果表明，在两个相中，局部位错密度都随沿入射X射线束的深度而变化，并且在γ矩阵中始终高于在γ '析出物中。X射线微衍射的结果与透射电子显微镜的观察结果基本一致。