Acquisition and analysis are described for scanning tunneling spectroscopy data acquired from a monolayer of WSe₂ grown on epitaxial graphene on SiC. Curve fitting of the data is performed, in order to deduce band edge energies. In addition to describing the details of the theoretical curves used for the fitting, the acquisition and analysis methods are also discussed within the larger context of the historical development of scanning tunneling spectroscopy techniques.

中文翻译：

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扫描隧道光谱数据的采集和分析—WSe2单层

描述了用于扫描隧道光谱数据的采集和分析，该数据是从生长在SiC上外延石墨烯上的单层WSe ₂获得的。进行数据的曲线拟合，以推断出带边能量。除了描述用于拟合的理论曲线的细节之外，还在扫描隧道光谱技术的历史发展的更大范围内讨论了采集和分析方法。