The carbon 1s photoelectron spectrum is the most widely fit and analyzed narrow scan in the x-ray photoelectron spectroscopy (XPS) literature. It is, therefore, critically important to adopt well-established protocols based on best practices for its analysis, since results of these efforts affect research outcomes in a wide range of different application areas across materials science. Unfortunately, much XPS peak fitting in the scientific literature is inaccurate. In this guide, we describe and explain the most common problems associated with C 1s narrow scan analysis in the XPS literature. We then provide an overview of rules, principles, and considerations that, taken together, should guide the approach to the analysis of C 1s spectra. We propose that following this approach should result in (1) the avoidance of common problems and (2) the extraction of reliable, reproducible, and meaningful information from experimental data.

中文翻译：

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X射线光电子能谱（XPS）实用指南：解释碳1s光谱

碳1s光电子能谱是X射线光电子能谱（XPS）文献中最广泛应用和分析的窄扫描。因此，至关重要的是采用基于最佳实践的公认方案进行分析，因为这些努力的结果会影响整个材料科学在广泛的不同应用领域中的研究成果。不幸的是，科学文献中许多XPS峰拟合都不准确。在本指南中，我们描述和解释XPS文献中与C 1s窄扫描分析相关的最常见问题。然后，我们提供了规则，原理和注意事项的概述，这些规则，原则和注意事项一起应指导C 1s光谱分析方法。