A versatile Arduino based source measure unit (ASMU) is fabricated for measuring both the DC and low-frequency AC electrical characteristics of multi-terminal semiconductor devices. The ASMU system is capable of bidirectional voltage sourcing and current measurement in all four quadrants. The system is programmed with the LabVIEW environment for real-time data acquisition. The voltage bias and current measurement range are observed to be 4.65 V and 14.6 mA with an optimum resolution of 5 mV and 7.8125 μA, respectively. Both the two- and three-terminal passive and active devices can be characterized without changing any circuit configuration. The electronic and optoelectronic current-voltage, current-time, and transistor’s input/output characteristics can be performed only by customizing the programming codes. The performance of the ASMU system is found to be highly comparable with commercial measurement systems. The experimental results suggest its potential application in characterizing semiconductor devices with maintaining adequate precision, cost-effectiveness, and low-power consumption.

一种通用的基于Arduino的源测量单元（ASMU）可以测量多端子半导体器件的直流和低频交流电特性。ASMU系统能够在所有四个象限中进行双向电压源和电流测量。该系统使用LabVIEW环境进行编程，以进行实时数据采集。电压偏置和电流测量范围被观察到4.65 V和14.6毫安用5毫伏和7.8125的最佳分辨率μA分别。两端子和三端子无源和有源器件都可以被表征，而无需更改任何电路配置。电子和光电的电流-电压，电流时间和晶体管的输入/输出特性只能通过自定义编程代码来执行。发现ASMU系统的性能与商业测量系统高度可比。实验结果表明，它在表征半导体器件时具有潜在的应用价值，同时可以保持足够的精度，成本效益和低功耗。