Functional broadside tests were developed to avoid overtesting of delay faults. The tests achieve this goal by creating functional operation conditions during their functional capture cycles. To increase the achievable fault coverage, close-to-functional scan-based tests are allowed to deviate from functional operation conditions. This article suggests that a more comprehensive functional broadside test set can be obtained by replacing target faults that cannot be detected with faults that have similar (but not identical) detection conditions. A more comprehensive functional broadside test set has the advantage that it still maintains functional operation conditions. It covers the test holes created when target faults cannot be detected by detecting similar faults. The article considers the case where the target faults are transition faults. When a standard transition fault, with an extra delay of a single clock cycle, cannot be detected, an unspecified transition fault is used instead. An unspecified transition fault captures the behaviors of transition faults with different extra delays. When this fault cannot be detected, a stuck-at fault is used instead. A stuck-at fault has some of the detection conditions of a transition fault. Multicycle functional broadside tests are used to allow unspecified transition faults to be detected. As a by-product, test compaction also occurs. The structure of the test generation procedure accommodates the complexity of producing functional broadside tests by considering the target as well as replacement faults together. Experimental results for benchmark circuits demonstrate the fault coverage improvements achieved, and the effect on the number of tests.

中文翻译：

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覆盖功能性宽边测试的测试孔

开发了功能性宽边测试以避免过度测试延迟故障。测试通过在其功能捕获周期中创建功能操作条件来实现这一目标。为了增加可实现的故障覆盖率，允许基于接近功能扫描的测试偏离功能操作条件。本文建议通过将无法检测到的目标故障替换为具有相似（但不相同）检测条件的故障，可以获得更全面的功能性广泛测试集。更全面的功能性宽边测试集的优势在于它仍然保持功能性操作条件。它涵盖了通过检测类似故障无法检测到目标故障时产生的测试孔。本文考虑了目标故障是转换故障的情况。当无法检测到带有单个时钟周期的额外延迟的标准转换故障时，将使用未指定的转换故障。未指定的转换故障捕获具有不同额外延迟的转换故障的行为。当无法检测到此故障时，将使用固定故障。固定故障具有转换故障的一些检测条件。多周期功能宽边测试用于检测未指定的转换故障。作为副产品，还会发生测试压实。测试生成过程的结构通过同时考虑目标和替换故障来适应产生功能性广泛测试的复杂性。基准电路的实验结果证明了故障覆盖率的提高，