Structured illumination microscopy (SIM) is one of the most powerful and versatile super-resolution methods due to its live-cell imaging ability of subcellular structures with high speed. In this paper, we propose an alternative SIM assisted by Bloch surface wave (BSW). Through replacing the conventional laser interference fringes with sub-diffraction BSW counterparts with higher spatial frequency, the imaging resolution of SIM could be enhanced greatly and the super-resolution imaging capability down to 80 nm could be achieved. Compared with traditional wide-field fluorescence microscopy, this BSW SIM demonstrates 2.78 times enhancement in imaging resolution, which surpasses general SIM with only 2 times improvement. Moreover, the structured illumination intensity could be boosted drastically, which is beneficial to nonlinear super-resolution imaging techniques, such as saturated SIM. This BSW SIM would provide a super-resolution, wide field of view approach for surface super-resolution fluorescent imaging while maintaining high imaging speed and good bio-compatibility.

中文翻译：

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低于100 nm分辨率的Bloch表面波辅助结构照明显微镜

结构照明显微镜（SIM）由于其对亚细胞结构的活细胞成像能力具有高速性，因此是最强大，用途最广泛的超分辨率方法之一。在本文中，我们提出了一种由Bloch表面波（BSW）辅助的SIM卡。通过用具有较高空间频率的亚衍射BSW对应物代替常规的激光干涉条纹，可以大大提高SIM的成像分辨率，并可以实现低至80 nm的超分辨率成像能力。与传统的宽视野荧光显微镜相比，该BSW SIM的成像分辨率提高了2.78倍，超过了普通SIM的2倍。而且，可以大大提高结构化照明强度，这对非线性超分辨率成像技术（例如饱和SIM）很有帮助。该BSW SIM将为表面超分辨率荧光成像提供超分辨率，宽视野的方法，同时保持高成像速度和良好的生物相容性。