In the modern System on Chip (SoC)-based designs, embedded memory occupies the majority of the area. Therefore, the demand for fast self-testing plays a vital role in the SoC device as its memory density increases. The focus of this research study is to provide a self-testing mechanism integrated with the SoC design for fault diagnosis and failure analysis. In particular, this paper proposes a controller design to test memories at SoC devices, called a memory built-in self-test (MBIST) controller. This controller works on the principle of the proposed March-ee (enhanced elements) algorithm with the primary objective to improve the test speed, fault coverage, and power consumption at a low area overhead. The complete design of the MBIST controller with the associated March-ee algorithm is minimal and easy to be integrated into any SoC device to provide a vibrant feature of memory fault detection. The results obtained are compared with that provided by the existing March algorithms, using the same design specifications, where the proposed March-ee MBIST controller has shown better results in terms of power consumption, fault coverage, timing, and area.

中文翻译：

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基于March-ee算法的MBIST控制器

在基于片上系统 (SoC) 的现代设计中，嵌入式存储器占据了大部分区域。因此，随着存储密度的增加，对快速自测试的需求在 SoC 器件中起着至关重要的作用。本研究的重点是提供一种与 SoC 设计集成的自测试机制，用于故障诊断和故障分析。特别是，本文提出了一种控制器设计来测试 SoC 设备上的内存，称为内存内置自测试 (MBIST) 控制器。该控制器根据所提出的 March-ee（增强元素）算法的原理工作，其主要目标是在较低的区域开销下提高测试速度、故障覆盖率和功耗。带有相关 March-ee 算法的 MBIST 控制器的完整设计是最小化的，并且易于集成到任何 SoC 设备中，以提供充满活力的内存故障检测功能。将获得的结果与现有 March 算法提供的结果进行比较，使用相同的设计规范，其中提出的 March-ee MBIST 控制器在功耗、故障覆盖率、时序和面积方面显示出更好的结果。