Zinc oxide (ZnO) nanowires play a pivotal role in the nanoworld due to their broad range of characteristics and applications. In this work, structural and optical properties of ZnO nanowires grown on indium doped tin oxide (ITO) coated glass have been modified by copper (Cu⁺⁺) ions irradiation at constant energy of 0.7 MeV. The X-ray diffraction (XRD), photoluminescence (PL), and field emission scanning electron microscope (FESEM) are used to examine changes in the nanowires. XRD results show that the crystallite size first decreases and then increases with high ion dose while peaks’ intensity decreases continuously with increasing the dose. The absence of (102) plane after irradiation depicts the defects formation. FESEM clearly shows the damage that occurred in the density of nanowires and also depicts the reduced charging effect with increasing dose. The PL spectra indicate the strong near-band edge peak and green luminescence enhancement has been recorded due to low dose ion irradiation.

氧化锌（ZnO）纳米线由于其广泛的特性和应用而在纳米世界中起着举足轻重的作用。在这项工作中，已通过铜（Cu ^++）改性了在掺有铟的氧化锡（ITO）的玻璃上生长的ZnO纳米线的结构和光学性质。）在0.7 MeV的恒定能量下进行离子辐照。X射线衍射（XRD），光致发光（PL）和场发射扫描电子显微镜（FESEM）用于检查纳米线的变化。XRD结果表明，随着离子剂量的增加，微晶尺寸先减小，然后增大，而峰强度随着剂量的增加而连续减小。照射后不存在（102）平面说明了缺陷的形成。FESEM清楚地显示了纳米线密度中发生的损坏，并且还描绘了随着剂量增加而降低的充电效果。PL光谱表明强的近带边缘峰，并且由于低剂量离子辐照已经记录了绿色发光增强。