Abstract

We propose an original approach to analyzing the exact solution of the direct problem in the theory of reflection that allows an algorithm for solving the inverse problem, including that in media with complex refractive indices, to be constructed. We suggest a complete set of seven observable parameters that is in a one-to-one correspondence with the complete set of structure material parameters. We derive the characteristic equation specifying the positions of the absolute minima of the reflection coefficient and the equation to calculate the layer thickness.

中文翻译：

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三层结构反射理论的反问题

摘要

我们提出了一种用于分析反射理论中直接问题的精确解的原始方法，该方法允许构造用于解决反问题（包括具有复杂折射率的介质中的反问题）的算法。我们建议一套完整的七个可观察参数，与一套完整的结构材料参数一一对应。我们导出了指定反射系数绝对最小值位置的特征方程式和计算层厚的方程式。