Reliability growth models are commonly used in the Department of Defense (DoD) to plan, track, and project reliability during system acquisition and testing. We describe two commonly used classes of reliability growth models for continuous failure time data and the metrics appropriate for their use. We also present two Bayesian reliability growth models that are based on the DoD models. The Bayesian models are easily interpretable in a statistical framework, which supports estimation and uncertainty quantification. Our goal is to provide a practical understanding of the development, implementation, and use of reliability growth models across a sequence of DoD testing events.

中文翻译：

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实用的可靠性增长建模

可靠性增长模型通常在国防部 (DoD) 中用于在系统采购和测试期间规划、跟踪和项目可靠性。我们描述了两种常用的连续故障时间数据的可靠性增长模型和适合它们使用的度量标准。我们还提出了两个基于 DoD 模型的贝叶斯可靠性增长模型。贝叶斯模型在支持估计和不确定性量化的统计框架中很容易解释。我们的目标是提供对 DoD 测试事件序列中可靠性增长模型的开发、实施和使用的实际理解。