In this work, we found that the electron-phonon interaction (EPI) is dependent on the surface roughness. Simulations of Resonance Raman Spectroscopy (RRS) spectra, show that the Fano asymmetry parameter $q$, decreases as the Mean Surface Roughness (MSR) increases. They also make it clear, that the magnitude of the EPI strength increases with increasing roughness. Our results also show that the EPI along with the surface morphology in an undoped CdTe sample allow the manifestation of other phonons in the RRS spectra. This work contributes to understand and potentially control the EPI in semiconductors.

中文翻译：

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表面粗糙度对本征CdTe单晶中电子与声子相互作用的影响

在这项工作中，我们发现电子-声子相互作用（EPI）取决于表面粗糙度。共振拉曼光谱（RRS）光谱的仿真表明，法诺不对称参数$q$随平均表面粗糙度（MSR）的增加而减小。他们还清楚地表明，EPI强度的幅度随粗糙度的增加而增加。我们的结果还表明，在未掺杂的CdTe样品中，EPI以及表面形态可以在RRS光谱中显示其他声子。这项工作有助于理解并潜在地控制半导体中的EPI。