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Current Trends in Development of Optical Metrology
Optical Memory and Neural Networks ( IF 1.0 ) Pub Date : 2020-12-23 , DOI: 10.3103/s1060992x20040025
O. V. Angelsky , P. P. Maksymyak , C. Yu. Zenkova , S. G. Hanson , Jun Zheng

Abstract

This review offers the reader some of the achievements of modern optical metrology. Over the past decades, it has become possible to make a leap in the basic approaches of metrology from the nano to the femto, approaching the pico level of measurements. Control of nano (micro) particle motion by an optical field and their use for testing complex optical fields; ultra-precise determination of the optical parameters of both solid and liquid and gas-like substances by optical methods; the tiny metrology of the phase shift of orthogonally polarized beams and the determination of their degree of mutual coherence, by interference methods and many other, are proposed for consideration in this paper. Optical metrology, which is provided by three-dimensional polarization distributions of optical fields, where structured light plays a special role; by using femtosecond lasers, and much more, demonstrates the prospects of optical methods in modern measuring systems.



中文翻译:

光学计量学的最新发展趋势

摘要

这篇评论为读者提供了现代光学计量学的一些成就。在过去的几十年中,从纳米到毫微微的计量基本方法已经接近飞跃级别的测量成为可能。通过光场控制纳米(微)粒子运动及其在测试复杂光场中的用途;通过光学方法超高精度测定固体和液体以及类气体物质的光学参数;本文提出了通过干涉法和其他方法确定正交偏振光束相移的微小度量以及确定它们的相干度的方法。光学计量学,是由光学场的三维偏振分布提供的,其中结构化光起特殊作用;

更新日期:2020-12-23
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