This review outlines fundamental principles, instrumentation, and capabilities of angle-resolved photoemission spectroscopy (ARPES) and microscopy. We will present how high-resolution ARPES enables to investigate fine structures of electronic band dispersions, Fermi surfaces, gap structures, and many-body interactions, and how angle-resolved photoemission microscopy (spatially-resolved ARPES) utilizing micro/nano-focused light allows to extract spatially localized electronic information at small dimensions. This work is focused on specific results obtained by the author from strongly correlated copper and ruthenium oxides, to help readers to understand consistently how these techniques can provide essential electronic information of materials, which can, in principle, apply to a wide variety of systems.

这篇综述概述了角分辨光发射光谱法（ARPES）和显微镜的基本原理，仪器和功能。我们将介绍高分辨率ARPES如何使电子带分散体的精细结构，费米表面，间隙结构和多体相互作用得以研究，以及如何利用微/纳米聚焦光来进行角度分辨光发射显微镜（空间分辨ARPES）允许以小尺寸提取空间定位的电子信息。这项工作的重点是作者从强相关的铜和钌氧化物中获得的特定结果，以帮助读者始终如一地理解这些技术如何能够提供材料的基本电子信息，这些信息原则上可以应用于多种系统。