In this article, we present the characterization of spin-wave exchange stiffness ( $D$ ) of a sputtered Ta (25 nm)/CoFeB (100 nm) thin film at room temperature (RT) and then annealed at 300 °C and 400 °C, respectively. The X-ray diffraction (XRD) results of the thin films indicate that the crystalline peak is obtained for the Ta/CoFeB thin film annealed at 400 °C. The magneto-dynamic properties are studied using ferromagnetic resonance (FMR) spectroscopy with an excitation frequency from 2 to 30 GHz and temperature variation from −173 °C to 27 °C. The damping factor for the annealed film at 400 °C shows a lower value compared with the other two samples. The exchange stiffness ( $D$ ) and temperature dependence are extracted by following the itinerant-electron model ( $T^{2}$ law) and suggest the existence of electron–magnon scattering in the film stack.

中文翻译：

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通过铁磁共振光谱研究 Ta/CoFeB 中自旋波的温度相关交换刚度

在本文中，我们介绍了自旋波交换刚度的表征（ $D$ ) 在室温 (RT) 下溅射的 Ta (25 nm)/CoFeB (100 nm) 薄膜，然后分别在 300 °C 和 400 °C 下退火。薄膜的 X 射线衍射 (XRD) 结果表明，在 400°C 下退火的 Ta/CoFeB 薄膜获得了结晶峰。使用铁磁共振 (FMR) 光谱研究磁动力学特性，激发频率为 2 至 30 GHz，温度变化范围为 -173 °C 至 27 °C。与其他两个样品相比，退火膜在 400 °C 时的阻尼系数显示出较低的值。交换刚度 ( $D$ ) 和温度依赖性是通过遵循巡回电子模型 ( $T^{2}$ 定律）并表明薄膜堆栈中存在电子-磁振子散射。