The dispersive properties of short-range surface plasmon polaritons are investigated at the buried interfaces in vacuum/Au/fused silica and vacuum/Au/SiO₂/Si multilayer systems for different gold film thicknesses of up to 50 nm using two-photon photoemission electron microscopy. The experimental data agrees excellently with results of transfer matrix method simulations, emphasizing the sensitivity of the plasmonic wave vector to the thickness of the gold film and an ultrathin native substrate oxide layer. The results furthermore illustrate the exceptional qualification of low-energy electron photoemission techniques in studying electronic excitations at buried interfaces.

利用双光子电子发射电子研究了真空/ Au /熔融石英和真空/ Au / SiO ₂ / Si多层系统中埋入界面的短程表面等离激元极化子的色散特性，适用于高达50 nm的金膜厚度显微镜检查。实验数据与转移矩阵方法仿真的结果非常吻合，强调了等离子波矢量对金膜和超薄天然衬底氧化物层厚度的敏感性。结果进一步说明了低能电子光发射技术在研究掩埋界面电子激发方面的特殊资格。