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The five‐analyzer point‐to‐point scanning crystal spectrometer at ESRF ID26
Journal of Synchrotron Radiation ( IF 2.4 ) Pub Date : 2020-12-18 , DOI: 10.1107/s1600577520015416
Pieter Glatzel , Alistair Harris , Philippe Marion , Marcin Sikora , Tsu-Chien Weng , Cyril Guilloud , Sara Lafuerza , Mauro Rovezzi , Blanka Detlefs , Ludovic Ducotté

X‐ray emission spectroscopy in a point‐to‐point focusing geometry using instruments that employ more than one analyzer crystal poses challenges with respect to mechanical design and performance. This work discusses various options for positioning the components and provides the formulas for calculating their relative placement. Ray‐tracing calculations were used to determine the geometrical contributions to the energy broadening including the source volume as given by the beam footprint on the sample. The alignment of the instrument is described and examples are given for the performance.

中文翻译:

位于ESRF ID26的五分析仪点对点扫描晶体光谱仪

使用采用不止一个分析器晶体的仪器在点对点聚焦几何结构中进行X射线发射光谱分析,对机械设计和性能提出了挑战。这项工作讨论了放置组件的各种方法,并提供了计算它们相对位置的公式。使用射线追踪计算来确定对能量展宽的几何贡献,包括样品上的光束足迹所给出的源体积。描述了仪器的对准方式,并给出了性能示例。
更新日期:2021-01-05
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