An X-ray fluorescence (XRF) imaging system was developed to analyze various materials based on characteristic X-rays emitted from objects exposed to X-ray flux. The XRF system can be used in various industrial fields, such as nuclear fuel analysis, to guarantee combustion stability in the nuclear reactor, glazed material analysis to preserve and restore ceramic cultural assets, impurity measurements in electronic circuits, and so on. In this study, we built an XRF imaging system and performed several material analyses using a lookup table, which contained energy and channel information of the characteristic X-ray peaks of each element. Ceramic specimens coated in various glazes were analyzed and imaged for oriental pottery research. Pigments of various colors were also analyzed and imaged for picture assessment, as were electronic circuits and gold plates. Ceramic, pigment, and metal components in the samples were discriminated by comparing characteristic X-ray peak data on the lookup table. Two-dimensional material images, which showed the material distribution of each sample, were successfully obtained.

中文翻译：

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基于 CdTe 探测器阵列的 X 射线荧光成像用于分析各种材料

开发了 X 射线荧光 (XRF) 成像系统，以根据暴露于 X 射线通量的物体发出的特征 X 射线来分析各种材料。XRF 系统可用于各种工业领域，例如核燃料分析以保证核反应堆中的燃烧稳定性，釉面材料分析以保护和修复陶瓷文化资产，电子电路中的杂质测量等。在这项研究中，我们构建了一个 XRF 成像系统，并使用查找表进行了多项材料分析，其中包含每个元素特征 X 射线峰的能量和通道信息。对涂有各种釉料的陶瓷样品进行分析和成像，用于东方陶器研究。还对各种颜色的颜料进行了分析和成像，以进行图片评估，电子电路和镀金板也是如此。通过比较查找表上的特征 X 射线峰数据来区分样品中的陶瓷、颜料和金属成分。成功获得了二维材料图像，显示了每个样品的材料分布。