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Interlaboratory comparison of angular‐dependent photovoltaic device measurements: Results and impact on energy rating
Progress in Photovoltaics ( IF 8.0 ) Pub Date : 2020-12-15 , DOI: 10.1002/pip.3365 Nicholas Riedel‐Lyngskær 1 , Adrián A. Santamaría Lancia 1 , Fabian Plag 2 , Ingo Kröger 2 , Malte R. Vogt 3 , Carsten Schinke 3, 4 , Rasmus S. Davidsen 5 , Mekbib Amdemeskel 1 , Mark J. Jansen 6 , Petra Manshanden 6 , Lenneke H. Slooff 6 , Anna J. Carr 6 , Martin Bliss 7 , Tom Betts 7 , Mikel E. Mayo 8 , Iñigo P. Jauregui 8 , Jose L. Balenzategui 9 , Ruben Roldan 10 , Giovanni Bellenda 10 , Mauro Caccivio 10 , Ulli Kräling 11 , Frank Neuberger 11 , Daniel Zirzow 12 , Jim Crimmins 12 , Charles Robinson 13 , Bruce King 13 , Wesley Teasdale 14 , Cherif Kedir 14 , John Watts 15 , Ryan Desharnais 15 , Peter B. Poulsen 1 , Michael L. Jakobsen 1 , Gisele A. Reis Benatto 1
Progress in Photovoltaics ( IF 8.0 ) Pub Date : 2020-12-15 , DOI: 10.1002/pip.3365 Nicholas Riedel‐Lyngskær 1 , Adrián A. Santamaría Lancia 1 , Fabian Plag 2 , Ingo Kröger 2 , Malte R. Vogt 3 , Carsten Schinke 3, 4 , Rasmus S. Davidsen 5 , Mekbib Amdemeskel 1 , Mark J. Jansen 6 , Petra Manshanden 6 , Lenneke H. Slooff 6 , Anna J. Carr 6 , Martin Bliss 7 , Tom Betts 7 , Mikel E. Mayo 8 , Iñigo P. Jauregui 8 , Jose L. Balenzategui 9 , Ruben Roldan 10 , Giovanni Bellenda 10 , Mauro Caccivio 10 , Ulli Kräling 11 , Frank Neuberger 11 , Daniel Zirzow 12 , Jim Crimmins 12 , Charles Robinson 13 , Bruce King 13 , Wesley Teasdale 14 , Cherif Kedir 14 , John Watts 15 , Ryan Desharnais 15 , Peter B. Poulsen 1 , Michael L. Jakobsen 1 , Gisele A. Reis Benatto 1
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This paper presents the results from an extensive interlaboratory comparison of angular‐dependent measurements on encapsulated photovoltaic (PV) cells. Twelve international laboratories measure the incident angle modifier of two unique PV devices. The absolute measurement agreement is ±2.0% to the weighted mean for angles of incidence (AOI) ≤ 65°, but from 70° to 85°, the range of measurement deviations increases rapidly from 2.5% to 23%. The proficiency of the measurements is analysed using the expanded uncertainties published by seven of the laboratories, and it is found that most of the angular‐dependent measurements are reproducible for AOI ≤ 80°. However, at 85°, one laboratory's measurement do not agree to the weighted mean within the stated uncertainty, and measurement uncertainty as high as 16% is needed for the laboratories without uncertainty to be comparable. The poor agreement obtained at 85° indicates that the PV community should place minimal reliance on angular‐dependent measurements made at this extreme angle until improvements can be demonstrated. The cloud‐based Daidalos ray tracing model is used to simulate the angular‐dependent losses of the mono‐Si device, and it is found that the simulation agrees to the median measurement within 0.6% for AOI ≤ 70° and within 1.4% for AOI ≤ 80°. Finally, the impact that the angular‐dependent measurement deviations have on climate specific energy rating (CSER) is evaluated for the six climates described in the IEC 61853‐4 standard. When one outlier measurement is excluded, the angular‐dependent measurements reported in this work cause a 1.0%–1.8% range in CSER and a 1.0%–1.5% range in annual energy yield, depending on the climate.
中文翻译：
角度相关光伏设备测量的实验室间比较：结果及其对能量额定值的影响
本文介绍了对封装的光伏（PV）电池进行角度相关测量的广泛实验室间比较结果。十二个国际实验室测量了两个独特PV设备的入射角修正器。入射角（AOI）≤65°时，绝对测量一致性为加权平均值的±2.0％，但从70°到85°，测量偏差范围从2.5％迅速增加到23％。使用七个实验室发布的扩展不确定度分析了测量的熟练程度，发现对于AOI≤80°，大多数与角度相关的测量都是可重复的。但是，在85°时，一个实验室的测量值在规定的不确定度内与加权平均值不一致，实验室需要高达16％的测量不确定度，而不确定度是可比的。在85°处获得的较差的一致性表明，PV社区应尽可能少地依赖在此极端角度下进行的角度相关测量，直到可以证明改进为止。基于云的Daidalos射线追踪模型用于模拟单晶硅器件随角度变化的损耗，发现该模拟对于AOI≤70°的中值测量值在0.6％内，对于AOI的中值测量值在1.4％内≤80°。最后，针对IEC 61853-4标准中描述的六种气候，评估了与角度相关的测量偏差对气候比能源额定值（CSER）的影响。如果排除一个异常值，则本研究报告的角度相关测量值将导致1.0％–1。
更新日期：2021-02-17
中文翻译：
角度相关光伏设备测量的实验室间比较：结果及其对能量额定值的影响
本文介绍了对封装的光伏（PV）电池进行角度相关测量的广泛实验室间比较结果。十二个国际实验室测量了两个独特PV设备的入射角修正器。入射角（AOI）≤65°时，绝对测量一致性为加权平均值的±2.0％，但从70°到85°，测量偏差范围从2.5％迅速增加到23％。使用七个实验室发布的扩展不确定度分析了测量的熟练程度，发现对于AOI≤80°，大多数与角度相关的测量都是可重复的。但是，在85°时，一个实验室的测量值在规定的不确定度内与加权平均值不一致，实验室需要高达16％的测量不确定度，而不确定度是可比的。在85°处获得的较差的一致性表明，PV社区应尽可能少地依赖在此极端角度下进行的角度相关测量，直到可以证明改进为止。基于云的Daidalos射线追踪模型用于模拟单晶硅器件随角度变化的损耗，发现该模拟对于AOI≤70°的中值测量值在0.6％内，对于AOI的中值测量值在1.4％内≤80°。最后，针对IEC 61853-4标准中描述的六种气候，评估了与角度相关的测量偏差对气候比能源额定值（CSER）的影响。如果排除一个异常值，则本研究报告的角度相关测量值将导致1.0％–1。
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