Abstract Oxygen electromigration studies have been carried out on long and submicron width strips of La0.85Sr0.15MnO3 (LSMO:0.15) film on LaAlO3 substrate with lithographically defined oxygen source created by local electrochemical oxidation. Electromigration by short duration current stressing leads to transition from a high resistance state (HRS) to a metastable low resistance state (LRS) that recovers back after a wait time (tW). Sustained current stressing beyond a critical current leads to irreversible RS transition to a stable LRS. The transition has an Arrhenius type temperature dependence with an activation energy ∼ 0.45-0.55 eV. Heating suppresses the transition and RS vanishes at a temperature T0≥ 375 K. It is suggested that the irreversible transition happens due to phase transition from a higher resistance Jahn-Teller distorted Orthorhombic phase (O′) to a undistorted Orthorhombic (O) phase which have close proximity at room temperature in LSMO:0.15 and are sensitive to current induced hole doping.

中文翻译：

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连接到工程氧源的亚微米宽度长条 La0.85Sr0.15MnO3 中氧的电迁移和电阻态跃迁

摘要 已经在 LaAlO3 衬底上的长和亚微米宽度的 La0.85Sr0.15MnO3 (LSMO:0.15) 薄膜条带上进行了氧电迁移研究，并使用由局部电化学氧化产生的光刻定义的氧源。短持续时间电流应力引起的电迁移导致从高电阻状态 (HRS) 过渡到亚稳态低电阻状态 (LRS)，该状态在等待时间 (tW) 后恢复。超过临界电流的持续电流应力导致不可逆的 RS 过渡到稳定的 LRS。该转变具有阿伦尼乌斯型温度依赖性，活化能约为 0.45-0.55 eV。加热抑制转变，并且 RS 在温度 T0≥375 K 时消失。