当前位置: X-MOL 学术IEEE Photon. J. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Optical multi-context blind scrubbing for field programmable gate arrays
IEEE Photonics Journal ( IF 2.1 ) Pub Date : 2020-12-01 , DOI: 10.1109/jphot.2020.3038900
Yusuke Takaki , Minoru Watanabe

This paper presents aproposal of a new optical multi-context blind scrubbing that can not only increase the soft-error tolerance of the configuration memory of field programmable gate arrays (FPGAs) but also support high-speed dynamic reconfiguration suitable for accelerating FPGA operations. The optical multi-context blind scrubbing operation uses a holographic memory as a soft-error free radiation-hardened external memory. It exploits its two-dimensional large-bandwidth optical bus. Optical multi-context blind scrubbing operation was demonstrated with four configuration contexts. The soft-error tolerance of the scrubbing operation was evaluated using a radiation tolerance experiment using two 4-MBq Americium-241 alpha particle sources. Results show the worst case mean time to repair (MTTR) of the scrubbing operation as 560 ns, which can realize sufficient soft-error tolerance in radiation-rich space environments.

中文翻译:

用于现场可编程门阵列的光学多上下文盲擦洗

本文提出了一种新的光学多上下文盲擦洗的建议,它不仅可以提高现场可编程门阵列 (FPGA) 配置存储器的软错误容限,而且还支持适用于加速 FPGA 操作的高速动态重新配置。光学多上下文盲擦洗操作使用全息存储器作为无软错误的抗辐射外部存储器。它利用其二维大带宽光总线。使用四个配置上下文演示了光学多上下文盲擦洗操作。使用两个 4-MBq Americium-241 α 粒子源的辐射耐受实验评估了擦洗操作的软错误耐受性。结果显示,洗涤操作的最坏情况平均修复时间 (MTTR) 为 560 ns,
更新日期:2020-12-01
down
wechat
bug