This report studies the feasibility of using X-ray Fluorescence for the characterization of alpha sources in a short time and proposes a new Rule of Thumb for the sake of simplicity. An uranium deposit of 0.012 $\pm$ 0.001 mg cm⁻² which XRF spectrum shows a low intensity U-L$\alpha$ peak at 13.61 keV, provides good resolution in alpha spectrometry. By this method, long data acquisition times in alpha spectrometry of poorly prepared sources are avoided without the need for expensive equipment.

中文翻译：

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一种新的经验法则，用于评估使用X射线荧光法通过电沉淀制备的α源

该报告研究了在短时间内使用X射线荧光表征α源的可行性，并为简单起见提出了新的经验法则。铀矿床0.012 $\pm$ 0.001 mg cm ^-2，XRF光谱显示低强度UL$\alpha$峰值在13.61 keV处，在α光谱中提供了良好的分辨率。通过这种方法，无需准备昂贵的仪器就可以避免在Alpha光谱仪中长时间采集数据。