Abstract. The maximum of Proton Induced X-ray Emission analytical technique on metamorphic rocks in geology has used 3 MeV range proton beams for excitation of thick targets. Protons of such energies do not accurately excite K-X–rays for high Z elements in matrix geological compositions like charnockite. In this analysis, low-energy PIXE (LE-PIXE) uses K-X-rays of Low Z elements and L-X-ray series for high Z elements. The resulting spectra between K-X-rays of light elements and L-X-rays of heavy elements can require striping techniques to resolve overlap difficulties in matrix composition. The results high Z elements in charnockite are to be expected, as the cross section for K-shell ionization of high-Z elements have greater values in the proton energy range of greater than 3 MeV in case of charnockite matrix composition. It has been suggested that the overlap of these discrete, gamma-rays with the X-ray spectrum may be serious problem in charnockite high energy PIXE (HE-PIXE) work, sufficient to preclude its use as a viable analytical technique. The conclusion proves that for a very complex matrix charnockite material of unknown chemistry, a HE-PIXE analytical spectrum may contain various X-ray and gamma peaks, some of which may overlap, making the analysis of line identities and the evaluation of X-ray counts intractable. It does not however represent any intrinsic drawback in HE-PIXE, nor does it mean that HE-PIXE is any more or less intractable than many other nuclear analytical techniques. Alternatively, the same analytical tool use could be made of gamma-rays in HE-PIXE as in low energy analytical tools like PIGE, NRA or INAA to obtain the results of charnockite at high Z completely.

中文翻译：

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夏诺石基体组成中高Z元素对HE-PIXE的要求

摘要。地质变质岩中质子感应X射线发射分析技术的最大值已使用3 MeV范围的质子束激发厚目标。这种能量的质子不能准确激发出象霞石这样的基质地质成分中高Z元素的KX射线。在此分析中，低能PIXE（LE-PIXE）使用低Z元素的KX射线和高Z元素的LX射线序列。轻元素的KX射线和重元素的LX射线之间产生的光谱可能需要剥离技术来解决基质组成中的重叠困难。可以预期得到锌矿中高Z元素的结果，因为在锌矿中基质组成的情况下，高Z元素的K壳电离截面在大于3 MeV的质子能范围内具有更大的值。已经提出，这些离散的，伽马射线与X射线光谱的重叠可能是霞石高能PIXE（HE-PIXE）工作中的严重问题，足以排除其用作可行的分析技术的可能性。结论证明，对于化学性质非常复杂的非常复杂的基质方钴矿材料，HE-PIXE分析光谱可能包含各种X射线和γ峰，其中某些峰可能重叠，从而进行了线身份分析和X射线评估十分棘手。但是，它并不代表HE-PIXE的任何内在缺陷，也不意味着HE-PIXE与许多其他核分析技术相比或多或少难处理。另外，HE-PIXE中的伽马射线可以与低能量分析工具（如PIGE，