Abstract We present the first results of a novel collaboration activity between ENEA Frascati Particle Accelerator Laboratory and University La Sapienza Guidance and Navigation Laboratory in the field of Radiation Hardness Assurance (RHA) for space applications. The aim of this research is twofold: (a) demonstrating the possibility to use the TOP-IMPLART proton accelerator for radiation hardness assurance testing, developing ad hoc dosimetric and operational procedures for RHA irradiations; (b) investigating system level radiation testing strategies for Commercial Off The Shelf (COTS) components of interest for SmallSats space missions, with focus on devices and sensors of interest for guidance, navigation and control, through simultaneous exploration of Total Ionizing Dose (TID), Displacement Damage (DD) dose and Single-Event Effects (SEE) with proton beams. A commercial 6-axis integrated Micro Electro-Mechanical Systems (MEMS) inertial navigation system (accelerometer, gyroscope) was selected as first Device Under Test (DUT). The results of experimental tests aimed to define an operational procedure and the characterization of radiation effects on the component are reported, highlighting the consequence of the device performance degradation in terms of the overall navigation system accuracy. Doses up to 50 krad(Si) were probed and cross sections for Single-Event Functional Interrupt (SEFI) evaluated at a proton energy of 30 MeV.

中文翻译：

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在 ENEA Frascati 质子直线加速器上对商用 6 轴 MEMS 惯性导航单元进行辐射测试

摘要 我们介绍了 ENEA Frascati 粒子加速器实验室与大学 La Sapienza 制导与导航实验室在空间应用辐射硬度保证 (RHA) 领域开展的一项新合作活动的初步成果。这项研究的目的有两个：(a) 证明使用 TOP-IMPLART 质子加速器进行辐射硬度保证测试的可能性，开发 RHA 辐射的特殊剂量测定和操作程序；(b) 通过同时探索总电离剂量 (TID)，研究小型卫星太空任务感兴趣的商用现货 (COTS) 组件的系统级辐射测试策略，重点是用于制导、导航和控制的感兴趣的设备和传感器, 质子束的位移损伤 (DD) 剂量和单事件效应 (SEE)。商用 6 轴集成微机电系统 (MEMS) 惯性导航系统（加速度计、陀螺仪）被选为第一个被测设备 (DUT)。报告了旨在定义操作程序和辐射对组件的影响特征的实验测试结果，突出了设备性能下降对整体导航系统精度的影响。探测了高达 50 krad(Si) 的剂量，并在 30 MeV 的质子能量下评估了单事件功能中断 (SEFI) 的横截面。报告了旨在定义操作程序和辐射对组件的影响特征的实验测试结果，突出了设备性能下降对整体导航系统精度的影响。探测了高达 50 krad(Si) 的剂量，并在 30 MeV 的质子能量下评估了单事件功能中断 (SEFI) 的横截面。报告了旨在定义操作程序和辐射对组件的影响特征的实验测试结果，突出了设备性能下降对整体导航系统精度的影响。探测了高达 50 krad(Si) 的剂量，并在 30 MeV 的质子能量下评估了单事件功能中断 (SEFI) 的横截面。