The impact of Ni doping on the morphological, electrical and dielectric properties in a polycrystalline sample of YMn_0.4Fe_0.6O₃ was investigated. SEM analysis reveals that grain size increases with the rise of Ni concentration in YMn_0.4Fe_0.6-xNi_xO₃ (x = 0, 0.05, 0.075 and 0.1) nanoparticles up to x = 0.075. The DC conductivity results indicate that all samples exhibit semiconductor behavior over the whole studied temperature range (240–440 K). In addition, the σ_DC curves show that the conductivity follows the same trend of the grain size with doping. AC conductivity measurements (σ_AC) are found to obey to Jonscher's universal power law. Actually, the results show that non-overlapping small polaron tunneling (NSPT) is the suitable model that helps to understand the conduction mechanism in our samples. Moreover, the contribution of both grain and grain boundaries in the conduction process is proved by Nyquist spectra which were fitted by an appropriate equivalent circuit. Based on dielectric measurements, it is found that dielectric losses are ruled by the DC conduction process.

研究了Ni掺杂对YMn _0.4 Fe _0.6 O ₃多晶样品的形貌，电学和介电性能的影响。SEM分析表明，随着YMn _0.4 Fe _0.6-x Ni _x O ₃（x = 0、0.05、0.075和0.1）纳米颗粒中x含量高达0.075的增加，晶粒尺寸随着Ni浓度的增加而增加。直流电导率结果表明，所有样品在整个研究温度范围（240–440 K）内均表现出半导体性能。另外，σ _DC曲线表明，电导率如下晶粒尺寸与掺杂的相同的趋势。AC电导率测量（σ _AC）被发现遵守琼舍尔的普遍权力法则。实际上，结果表明，不重叠的小极化子隧穿（NSPT）是合适的模型，有助于理解我们样品中的传导机理。此外，通过适当的等效电路拟合的奈奎斯特光谱证明了晶粒和晶界在导电过程中的贡献。基于介电测量，发现介电损耗由直流传导过程控制。