The powder diffraction profile obtained with a pink‐beam synchrotron X‐ray source is described as the convolution of a back‐to‐back pair of exponentials convoluted with the Gaussian and Lorentzian components of a pseudo‐Voigt. This new function is employed for the first time in a Rietveld refinement using data collected from a single 100 ps synchrotron X‐ray micropulse.

中文翻译：

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“粉”束X射线粉末衍射图及其在Rietveld精制中的应用

用粉光束同步加速器X射线源获得的粉末衍射图描述为背对背指数对与伪Voigt的高斯分量和洛伦兹分量卷积的卷积。使用从单个100 ps同步加速器X射线微脉冲收集的数据，此新功能首次在Rietveld改进中使用。