In flash sintering experiments, the thermal history of the sample is key to understanding the mechanisms underlying densification rate and final properties. By combining robust temperature measurements with current-ramp-rate control, this study examined the effects of the thermal profile on the flash sintering of yttria-stabilized zirconia, with experiments ranging from a few seconds to several hours. The final density was maximized at slower heating rates, although processes slower than a certain threshold led to grain growth. The amount of grain growth observed was comparable to a similar conventional thermal process. The bulk electrical conductivity correlated with the maximum temperature and cooling rate. The only property that exhibited behavior that could not be attributed to solely the thermal profile was the grain boundary conductivity, which was consistently higher than conventional in flash sintered samples. These results suggest that, during flash sintering, athermal electric field effects are relegated to the grain boundary.

在快速烧结实验中，样品的热历史是了解致密化速率和最终性能的机理的关键。通过将可靠的温度测量值与电流斜坡速率控制相结合，本研究研究了温度曲线对氧化钇稳定的氧化锆快速烧结的影响，实验范围从几秒钟到几小时不等。最终密度在较低的加热速率下达到最大，尽管过程低于某个阈值会导致晶粒生长。观察到的晶粒生长量与类似的常规热处理相当。整体电导率与最高温度和冷却速率相关。表现出不能仅仅归因于热分布的行为的唯一特性是晶界电导率，在闪速烧结样品中始终高于常规。这些结果表明，在快速烧结期间，无热电场效应被降到晶界。