Abstract Oxynitride perovskites are an emerging class of materials that have intriguing electrical and optical properties that can be used for a wide variety of novel applications. The arrangement of the anions significantly drives these properties, but it is difficult to assess the anion arrangements in thin film samples. Inverse photoelectron holography is an atomic resolution holography technique that can directly measure the local structure around atoms of light elements in a sample. The holograms of the anions in SrTaO 2 N thin films were obtained and a remarkable difference was found between the O and N holograms. Analysis of the holographic features and simulations suggests that the sample consists of trans-type anion ordering. A new structural model consisting of trans-type structures where the N anions are aligned in different directions was proposed, and the resulting simulated hologram agrees well with the experiment.

中文翻译：

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逆光电子全息法氧氮化钙钛矿薄膜阴离子排列分析

摘要氧氮化钙钛矿是一类新兴的材料，具有引人入胜的电学和光学特性，可用于各种新应用。阴离子的排列显着驱动了这些特性，但很难评估薄膜样品中的阴离子排列。逆光电子全息是一种原子分辨率全息技术，可以直接测量样品中轻元素原子周围的局部结构。获得了SrTaO 2 N薄膜中阴离子的全息图，发现O和N全息图之间存在显着差异。全息特征和模拟的分析表明样品由反式阴离子排序组成。