A microwave frequency measurement system utilizing the optical injection technology in a semiconductor laser is proposed. A single-wavelength optical carrier is generated and divided into two parts. One part is intensity-modulated by a control signal with a triangular shape and then injected into a semiconductor laser to generate a frequency scanning optical sideband. The other part is modulated by the microwave signal under test, which is then coupled with the frequency scanning optical sideband and detected by a photodetector (PD). The output of the PD is filtered by an electrical passband filter and detected by an envelope detector. Electrical pulses will be obtained with the time interval proportional to the microwave frequency. Thus the microwave frequency can be retrieved from the time interval of the generated pulses. A proof of concept experiment is taken. The microwave frequency measurement from 3 to 40 GHz is achieved, and the frequency measurement errors are within ±30 MHz.

中文翻译：

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基于光注入半导体激光器的微波频率测量

提出了一种利用半导体激光器中的光注入技术的微波频率测量系统。产生单波长光载波并分成两部分。一部分经三角形控制信号强度调制后注入半导体激光器，产生频率扫描光边带。另一部分由被测微波信号调制，然后与频率扫描光学边带耦合并由光电探测器（PD）检测。PD 的输出由电子通带滤波器滤波并由包络检测器检测。将获得与微波频率成正比的时间间隔的电脉冲。因此，可以从产生的脉冲的时间间隔中检索微波频率。进行了概念验证实验。实现了3~40GHz的微波频率测量，频率测量误差在±30MHz以内。