An estimate of synchrotron hard X‐ray incident beam polarization is obtained by partial two‐dimensional image masking followed by integration. With the correct polarization applied to each pixel in the image, the resulting one‐dimensional pattern shows no discontinuities arising from the application of the mask. Minimization of the difference between the sums of the masked and unmasked powder patterns allows estimation of the polarization to ±0.001.

中文翻译：

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从二维图像确定硬X射线偏振

通过部分二维图像掩膜然后进行积分，可以获得对同步加速器硬X射线入射光束偏振的估计。通过将正确的偏振应用于图像中的每个像素，所得到的一维图案不会显示因遮罩的使用而引起的不连续性。掩盖和未掩盖粉末图案总和之间的差异最小，可将偏振估计为±0.001。