The electrical conductivity of two‐dimensional (2D) materials without any electrical contact can be obtained using two different methods: the terahertz time domain spectroscopy (THz‐TDS) method, in the range from GHz up to 2 THz, and with a rutile dielectric resonator (RDR), in which case the conductivity is obtained at the resonant frequency of the device, close to 9.0 GHz. In one case (THz‐TDS in a transmission setup), the sample is directly focused. In the other case (RDR), the sample is placed inside the resonant cavity working at ${\text{TE}}_{011}$ mode and must have exactly the same surface size as the cavity, 12 × 12 mm in our device. From the Q factor variation of the resonant cavity due to the sample, its surface resistance is extracted. These measurements are performed on different 2D materials: graphene and ${\text{WS}}_2$. Both methods are analyzed and compared. For few‐layer 2D samples, the THz‐TDS method is suitable.

中文翻译：

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二维材料的高频非接触式表征。石墨烯，WS2

可以使用两种不同的方法获得没有任何电接触的二维（2D）材料的电导率：太赫兹时域光谱（THz-TDS）方法，范围从GHz到2 THz，并且具有金红石电介质谐振器（RDR），在这种情况下，可以在接近9.0 GHz的器件谐振频率下获得电导率。在一种情况下（传输设置中为THz-TDS），直接对样本进行聚焦。在另一种情况下（RDR），将样品放置在共振腔内，在${\text{TE}}_{011}$模式，并且必须与空腔完全相同的表面尺寸，在我们的设备中为12×12 mm。从样品引起的谐振腔的Q因子变化中，提取其表面电阻。这些测量是在不同的2D材料上执行的：石墨烯和${\text{WS}}_2$。分析和比较了两种方法。对于几层2D样本，THz-TDS方法是合适的。