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The transport of tungsten impurities induced by the intrinsic carbon during upper-single null discharge on EAST tokamak
Nuclear Materials and Energy ( IF 2.3 ) Pub Date : 2020-11-19 , DOI: 10.1016/j.nme.2020.100849
Qingrui Zhou , Chaofeng Sang , Guoliang Xu , Rui Ding , Xuele Zhao , Yilin Wang , Dezhen Wang

The transport as well as accumulation of tungsten (W) impurity is one of the critical issues for the W divertor operation. The EAST tokamak with W and graphite divertor targets, provides a good platform for the investigation of W impurity behaviors. In this work, the production, transport and accumulation of W impurities are simulated via the SOLPS-DIVIMP modeling. The plasma background is obtained by the SOLPS simulations, while the W sputtering yield is calculated via empirical formula, and the following W transport is traced using the DIVIMP code. The W impurity source is mainly contributed by the incidence of carbon (C) impurity in this simulation. The distribution of W ions with different charge states is obtained and the transport of the W ions is analyzed by the net forces. The dependences of W impurity on the ne,sepOMP and PSOL are illustrated, which show the divertor plasma has great impact on the W impurity distribution. The increase of ne,sepOMP can suppress the W impurity in the core region with the fixed PSOL, while higher input power can enhance the W concentration significantly. The W impurity can lead to sufficient power radiation due to strong impurity source and high radiation rate in the core region during low density discharge, while the influence becomes weaker as ne,sepOMP raises. The effects of self-sputtering on the W impurity accumulation are also discussed. With the increment of PSOL, the sputtering and self-sputtering of W increase remarkably, leading to the W ions concentration exceed 10−5 in the core–edge interface (CEI). Moreover, the strong correlation between Te at the outer target and W ion density at CEI is observed, showing that Te < 20 eV is required to maintain W concentration at CEI below the acceptable limitation (10−5) in steady-state scenarios in EAST (without ELMs).



中文翻译:

在EAST托卡马克上一次零放电中本征碳诱导的钨杂质的迁移。

钨杂质的运输以及积累是钨分流器运行的关键问题之一。具有W和石墨偏滤器靶的EAST托卡马克,为研究W杂质行为提供了一个很好的平台。在这项工作中,通过SOLPS-DIVIMP模型模拟了W杂质的产生,运输和积累。通过SOLPS模拟获得等离子体背景,同时通过经验公式计算W溅射产率,并使用DIVIMP代码追踪随后的W传输。在此模拟中,W杂质源主要是由碳(C)杂质的产生引起的。获得了具有不同电荷状态的W离子的分布,并通过净力分析了W离子的传输。钨杂质对硅的影响ñËsËpOMP示出了P SOLP SOL,其表明偏滤器等离子体对W杂质分布具有很大的影响。增加ñËsËpOMP固定P SOL可以抑制核心区域中的W杂质,而更高的输入功率可以显着提高W浓度。在低密度放电期间,由于强杂质源和核心区域的高辐射率,W杂质可导致足够的功率辐射,而随着ñËsËpOMP加薪。还讨论了自溅射对W杂质积累的影响。随着P SOL的增加,W的溅射和自溅射显着增加,导致芯边缘界面(CEI)中的W离子浓度超过10 -5。此外,观察到外部目标处的T e与CEI处的W离子密度之间有很强的相关性,表明在稳态情况下,要使 CEI处的W浓度保持在可接受的限制(10 -5)以下,需要T e <20 eV在EAST中(没有ELM)。

更新日期:2020-12-01
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