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Ablation threshold and crater morphology of amorphous and crystalline SiO2 glass for extreme ultraviolet femtosecond pulses
Japanese Journal of Applied Physics ( IF 1.5 ) Pub Date : 2020-11-18 , DOI: 10.35848/1347-4065/abc85a
T. Shibuya 1 , K. Sakaue 2 , H. Ogawa 1, 3 , T.-H. Dinh 4 , D. Satoh 1, 3 , E. Terasawa 3, 5 , M. Washio 5 , M. Tanaka 1, 3 , T. Higashiguchi 6 , M. Ishino 4 , Y. Kubota 7, 8 , Y. Inubushi 7, 8 , S. Owada 7, 8 , M. Nishikino 4 , Y. Kobayashi 9 , R. Kuroda 1, 3
Affiliation  

The ablation threshold fluence and crater morphology of amorphous and crystalline SiO2 glass were analyzed in the regime of an extreme ultraviolet femtosecond pulse. Despite the difference between the densities (or optical penetration depths) of amorphous and crystalline SiO2 glass, the ablation threshold fluences and crater morphologies were found to be comparable. In addition, we compared our experimental results at a 10.3nm wavelength with those in a previous work at a 13.5 nm wavelength. We conclude that the impact of the difference in density or optical penetration depth of several tens of percent on the ablation process is limited.



中文翻译:

极紫外飞秒脉冲的非晶和结晶SiO 2玻璃的烧蚀阈值和坑口形态

在极紫外飞秒脉冲的范围内,分析了非晶和结晶SiO 2玻璃的烧蚀阈值通量和火山口形态。尽管非晶态和结晶态SiO 2玻璃的密度(或光学穿透深度)之间存在差异,但发现烧蚀阈值通量和火山口形貌可比。另外,我们将我们在10.3nm波长处的实验结果与先前工作中在13.5nm波长处的实验结果进行了比较。我们得出的结论是,密度差异或百分之几十的光学穿透深度对消融过程的影响是有限的。

更新日期:2020-11-18
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