Nanotechnology is, first of all, an issue regarding dimensional aspects that have an impact on all the other considerations. Depending on the interest area, the impact of nanotechnology is observed in design, fabrication process, and utilization. To cope with certification procedures, for instance, and their performance, measurements and instrumentation are key points of this complex mosaic. The IEEE Instrumentation and Measurement Society (IMS) developed a technical committee to strongly deal with nanotechnology in instrumentation and measurements called TC-34. Its activities are introduced here, along with a description of its spinoff event called NANOfIM which is a conference with an insight into the nanotechnology world. The first NANOfIM was held in 2015 in Lecce (Italy).

中文翻译：

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纳米技术领域需要测量和仪器：IEEE IMS TC-34 经验


纳米技术首先是一个关于尺寸方面的问题，它影响所有其他考虑因素。根据感兴趣的领域，可以观察纳米技术在设计、制造过程和利用方面的影响。例如，为了应对认证程序及其性能，测量和仪器是这个复杂的马赛克的关键点。 IEEE 仪器和测量协会 (IMS) 成立了一个技术委员会，专门处理仪器和测量中的纳米技术问题，称为 TC-34。这里介绍了它的活动，以及对其名为 NANOfIM 的衍生活动的描述，该会议是一个深入了解纳米技术世界的会议。第一届 NANOfIM 于 2015 年在莱切（意大利）举行。