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Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review
IETE Technical Review ( IF 2.5 ) Pub Date : 2020-11-12 , DOI: 10.1080/02564602.2020.1843552 Vinay Kumar 1 , Lalit Kumar Singh 2 , Anil Kumar Tripathi 2
中文翻译:
电子设备的可靠性预测方法:最新评论
更新日期:2020-11-12
IETE Technical Review ( IF 2.5 ) Pub Date : 2020-11-12 , DOI: 10.1080/02564602.2020.1843552 Vinay Kumar 1 , Lalit Kumar Singh 2 , Anil Kumar Tripathi 2
Affiliation
Today, numerous reliability prediction methods exist for electronic systems. A detailed literature survey is conducted to investigate the various techniques/models to ensure electronic components/system's reliability. Based on such a method's merits and limitations, we recommend using the hybrid model to predict an electronic system's reliability prediction in the distinct development phase of the product life cycle to get higher accuracy.
中文翻译:
电子设备的可靠性预测方法:最新评论
今天,存在许多用于电子系统的可靠性预测方法。进行了详细的文献调查以研究各种技术/模型,以确保电子元件/系统的可靠性。基于这种方法的优点和局限性,我们建议使用混合模型来预测电子系统在产品生命周期的不同开发阶段的可靠性预测,以获得更高的准确性。