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Double differential distributions of e-emission in ionization of N2 by 3, 4 and 5 keV electron impact
Journal of Physics B: Atomic, Molecular and Optical Physics ( IF 1.6 ) Pub Date : 2020-11-11 , DOI: 10.1088/1361-6455/abbe2b
Madhusree Roy Chowdhury 1, 2 , Dhaval Chauhan 2 , Chetan G Limbachiya 2 , Karoly Tőksi 3 , Christophe Champion 4 , Philippe F Weck 5 , Lokesh C Tribedi 1
Affiliation  

We report the measurement of the absolute double differential cross sections (DDCS) of secondary electrons emitted due to the ionization of N2 molecule in collisions with fast electrons having energies between 3 and 5 keV. The emitted electrons with energies from 1–500 eV have been measured for different forward and backward emission angles. The measured DDCS have been compared with the state-of-the-art first Born approximation with correct boundary condition (CB1) model calculations as well as with the classical trajectory Monte Carlo (CTMC) method. From the measured DDCS, the single differential cross sections (SDCS) as a function of the emission energies have been computed and eventually the total ionization cross sections (TCS) have been derived. The TCS values are also compared with a semi-empirical calculation, namely, the CSP-ic (complex scattering potential-ionization contribution) model.



中文翻译:

N ,3、4和5 keV电子碰撞使N 2电离时电子发射的双微分分布

我们报告了由于N 2的电离而发出的二次电子的绝对双微分截面(DDCS)的测量分子与能量在3-5 keV之间的快速电子碰撞。已针对不同的正向和反向发射角测量了能量为1–500 eV的发射电子。已将测得的DDCS与具有正确边界条件(CB1)模型计算的最新的第一波恩逼近法以及经典轨迹蒙特卡洛(CTMC)方法进行了比较。从测得的DDCS中,已经计算出作为发射能量的函数的单个微分截面(SDCS),并最终得出了总电离截面(TCS)。还将TCS值与半经验计算(即CSP-ic(复杂散射势电离贡献)模型)进行比较。

更新日期:2020-11-11
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