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Reduced Graphene Oxide Thin Film with Strong Optical Nonlinearity
Physica Status Solidi (B) - Basic Solid State Physics ( IF 1.5 ) Pub Date : 2020-11-10 , DOI: 10.1002/pssb.202000397 Behzad Heidari 1, 2, 3 , Morteza Sasani Ghamsari 2 , Somayeh Salmani 4 , Mehrnoush Ahmadi 3 , Mohammad Hossein Majles‐Ara 1, 4
Physica Status Solidi (B) - Basic Solid State Physics ( IF 1.5 ) Pub Date : 2020-11-10 , DOI: 10.1002/pssb.202000397 Behzad Heidari 1, 2, 3 , Morteza Sasani Ghamsari 2 , Somayeh Salmani 4 , Mehrnoush Ahmadi 3 , Mohammad Hossein Majles‐Ara 1, 4
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Herein, a simple, low‐cost, and scalable process is developed to prepare the reduced graphene oxide (rGO) thin films (TFs) with strong optical nonlinearity. To do so, a chemical reduction method (using inorganic agent hydroiodic acid) and drop‐casting technique are used. Optical nonlinearity of the prepared thin rGO film is measured by the Z‐scan technique at low light intensity (continuous‐wave wavelength of 632 nm). The result of optical nonlinearity responses is illustrated by a remarkable nonlinear refraction index (n2 ≈ 10−4 cm2 W−1) as well as a considerable nonlinear absorption coefficient (β = 1.43 × 10−8 cm2 W–1) compared with similar reported results. Moreover, experimental results show that the prepared film enjoys a positive nonlinear refractive index with strong optical nonlinearity. Results also confirm that the changes made in optical absorption of rGO TFs are due to state filling effects and the optical nonlinearity proportional to the carriers’ density is in fact due to thermal effects of SiO2 substrate.
中文翻译：
具有强光学非线性的还原氧化石墨烯薄膜
本文中，开发了一种简单，低成本且可扩展的工艺来制备具有强光学非线性的还原氧化石墨烯（rGO）薄膜（TF）。为此，使用了化学还原法（使用无机剂氢碘酸）和滴铸技术。制备的rGO薄膜的光学非线性是通过Z扫描技术在低光强度（连续波波长为632 nm）下测量的。的光学非线性响应的结果是通过显着的非线性折射率（示Ñ 2 ≈10 -4 厘米2 w ^ -1）以及相当大的非线性的吸收系数（β = 1.43×10 -8 厘米2 w ^ -1）与类似的报告结果进行比较。此外，实验结果表明，所制备的膜具有正的非线性折射率，且具有强烈的光学非线性。结果还证实，rGO TFs的光吸收变化是由于状态填充效应引起的，而与载流子密度成比例的光学非线性实际上是由于SiO 2衬底的热效应引起的。
更新日期：2020-11-10
中文翻译：
具有强光学非线性的还原氧化石墨烯薄膜
本文中，开发了一种简单，低成本且可扩展的工艺来制备具有强光学非线性的还原氧化石墨烯（rGO）薄膜（TF）。为此，使用了化学还原法（使用无机剂氢碘酸）和滴铸技术。制备的rGO薄膜的光学非线性是通过Z扫描技术在低光强度（连续波波长为632 nm）下测量的。的光学非线性响应的结果是通过显着的非线性折射率（示Ñ 2 ≈10 -4 厘米2 w ^ -1）以及相当大的非线性的吸收系数（β = 1.43×10 -8 厘米2 w ^ -1）与类似的报告结果进行比较。此外，实验结果表明，所制备的膜具有正的非线性折射率，且具有强烈的光学非线性。结果还证实，rGO TFs的光吸收变化是由于状态填充效应引起的，而与载流子密度成比例的光学非线性实际上是由于SiO 2衬底的热效应引起的。
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