Abstract This study concentrated on the attenuation characteristics of the set of Cu2SnZnS4, Cu2SnZnSe4, and Cu2SnZnTe4 semiconductor compounds at various photon energies using Phy-X/PSD and Phy-X/ZeXTRa software. The estimated interaction parameters (MAC, LAC, HVL, TVL, MFP, ACS, ECS, Zeff, Neff, Ceff, Zeq, R, EBF, and EABF) were plotted as a function of gamma energy ranged from 0.015 to 15 MeV for the selected compounds. The shielding properties of the interactions between the tested compounds and the proton, alpha, carbon, electron, and photon radiations were studied in detail. Cu2SnZnTe4 sample has a higher MAC, LAC, ACS, ECS, Zeff, Ceff, and Zeq values. In contrast, Cu2SnZnS4 has the lowest of such parameters. Based on Phy-X/ZeXTRa software, the effective atomic number Zeff for the total alpha, carbon ion, proton, and electron interactions was evaluated to reach the maxima for Te- containing compound and the minima for the S-containing compound. The obtained data from Phy-X/PSD software confirmed that Cu2SnZnSe4 is the best compound for neutron shielding applications. Thus, even when gamma-ray exposure is possible, these semiconductors, specially Cu2SnZnTe4, can be safely used as an international alternative to different radiation devices, sensors, and medical applications.

中文翻译：

---

Cu2SnZn(S,Se,Te)4 半导体材料伽马衰减性能的新方法：与质子、α、碳、电子和光子的辐射相互作用

摘要 本研究使用 Phy-X/PSD 和 Phy-X/ZeXTRa 软件集中研究了一组 Cu2SnZnS4、Cu2SnZnSe4 和 Cu2SnZnTe4 半导体化合物在不同光子能量下的衰减特性。估计的相互作用参数（MAC、LAC、HVL、TVL、MFP、ACS、ECS、Zeff、Neff、Ceff、Zeq、R、EBF 和 EABF）被绘制为伽马能量的函数，范围从 0.015 到 15 MeV，用于选定的化合物。详细研究了测试化合物与质子、α、碳、电子和光子辐射之间相互作用的屏蔽特性。Cu2SnZnTe4 样品具有更高的 MAC、LAC、ACS、ECS、Zeff、Ceff 和 Zeq 值。相比之下，Cu2SnZnS4 具有最低的这些参数。基于 Phy-X/ZeXTRa 软件，总α、碳离子、质子、评估电子相互作用以达到含 Te 化合物的最大值和含 S 化合物的最小值。从 Phy-X/PSD 软件获得的数据证实，Cu2SnZnSe4 是中子屏蔽应用的最佳化合物。因此，即使可以进行伽马射线照射，这些半导体，特别是 Cu2SnZnTe4，也可以安全地用作不同辐射设备、传感器和医疗应用的国际替代品。